Mostrando postagens com marcador AFM. Mostrar todas as postagens
Mostrando postagens com marcador AFM. Mostrar todas as postagens

16 de ago. de 2012

Conceitos Básicos de um Scanning Probe Microscope (SPM)

Animação feita pelo Imaging Technology Group do Beckman Institue da Universidade de Illinois mostrando os conceitos básicos de um SPM e as três principais modalidades: STM, AFM de contato e AFM de contato intermitente.

Para acessar a animação, clique aqui.

3 de ago. de 2012

AFM compacto: instalação com detalhes

Vídeo interessante sobre a instalação de um modelo compacto de um microscópio de forca atômica. É bom de se ver detalhes do equipamento.




Easy to use scanning tunneling microscope to image conducting surfaces and to investigate effects and characteritics on atomic and molecular scale. A variety of experiments in the fields of Material Sciences, Solid State Physics/Chemistry, Nanotechnology and Quantum Mechanics can be performed. For example: micro- and nano morphology of surfaces, nano structures, imaging of atoms and molecules, conductivity, tunneling effect, charge density waves, single molecule contacts, and nanostructuring by self organisation (self assembled monolayers).
Benefits:
* Out-of-the-box-device incl. all necessary accessories for a prompt entry into the world of atoms and molecules * Portable and compact: transportable, easy to install with a small footprint * Single device for more stable measurements * Quick atomic resolution on a normal table. No need for expensive vibration isolation * Easy to use: Ideal for nanotechnology education, preparing students for their work on high-level research devices, and outreach * Accessible sample stage and scanning tip: Quick exchange of tip and sample * Low operating voltage: Safe for all users